Halbleiterprüfsysteme
(5)
LDBI-Laseralterung Halbleiterprüfsysteme Mehrkanalprüfsystem
Preis: Negotiable
MOQ: 1 unit
Lieferzeit: 2-8 weeks
Marke: PRECISE INSTRUMENT
Markieren:Laser Aging Semiconductor Test Systems, LDBI Semiconductor Test Systems, Multi Channel Power Device Analyzer
LDBI Laser Aging Semiconductor Test Systems Multi Channel Testing System LDBI multi-channel high-power laser aging system is specifically designed to address the issues of kilowatt-level high-power semiconductor laser chips and pump laser modules that require narrow pulse high current testing and ag... Mehr sehen
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1200V/100A Halbleiterparameter-Analysator SPA6100 Halbleiterprüfsysteme
Preis: Negotiable
MOQ: 1 unit
Lieferzeit: 2-8 weeks
Marke: PRECISE INSTRUMENT
Markieren:1200V/100A Semiconductor Parameter Analyzer, SPA6100 Semiconductor Test Systems, SPA6100 Semiconductor Parameter Analyzer
1200V/100A Semiconductor Parameter Analyzer SPA6100 Semiconductor Test Systems The SPA6100 Semiconductor Parameter Analyzer offers advantages including high precision, wide measurement range, rapid flexibility, and strong compatibility. This product supports simultaneous testing of DC current-voltag... Mehr sehen
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10kV/6000A Leistungsanalysator Statikprüfung PMST für Mosfet BJT IGBT SiC GaN Halbleiter
Preis: Negotiable
MOQ: 1 unit
Lieferzeit: 2-8 weeks
Marke: PRECISE INSTRUMENT
Markieren:10kV/6000A Power Device Analyzer, Analyzer Static Test PMST, BJT IGBT Power Device Analyzer
10kV/6000A Power Device Analyzer Static Test PMST For MOSFET BJT IGBT And SiC GaN Semiconductors PMST Static Parameter Test System for Power Devices integrates multiple measurement and analysis functions, enabling precise testing of static parameters for various power devices (e.g., MOSFETs, BJTs, I... Mehr sehen
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10Hz-1MHz Halbleitergerät C-V-Prüfsystem
Preis: Negotiable
MOQ: 1 unit
Lieferzeit: 2-8 weeks
Marke: PRECISE INSTRUMENT
Markieren:1MHz Semiconductor Power Device, 10Hz Semiconductor Power Device, C-V Semiconductor Characterization System
10Hz-1MHz Semiconductor Device C-V Testing System Capacitance-Voltage (C-V) Measurement is widely used to characterize semiconductor parameters, particularly in MOS capacitors (MOS CAPs) and MOSFET structures. The capacitance of a metal-oxide-semiconductor (MOS) structure is a function of the applie... Mehr sehen
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1000A Stromsensorprüfsystem CTMS Halbleiterprüfgerät
Preis: Negotiable
MOQ: 1 unit
Lieferzeit: 2-8 weeks
Marke: PRECISE INSTRUMENT
Markieren:1000A Current Sensor Test System, CTMS Semiconductor Testing Equipment, 1000A CTMS Semiconductor Testing
1000A Current Sensor Test System CTMS Semiconductor Testing Equipment CTMS test system integrates a variety of measurement and analysis functions, and can accurately measure the static and dynamic parameters of various current sensors (Hall current sensors, Rogowski coils, Pilsner coils, etc.), with... Mehr sehen
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